a wafer metrology consortium under MAGNET

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KLA-Tencor Introduces Comprehensive Wafer Inspection and Review Portfolio for Leading IC Technologies

14 July, 2016

KLA-Tencor Introduces Comprehensive Wafer Inspection and Review Portfolio for Leading IC Technologies

 Advanced Defect Discovery and Process Monitoring Address 10nm Yield Challenges

 

http://www.prnewswire.com/news-releases/kla-tencor-introduces-comprehensive-wafer-inspection-and-review-portfolio-for-leading-ic-technologies-300296645.html