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More than Metro - Enabling Next Generation Semi Metrology - The Israeli 450Metro Consortium's Fourth Annual Conference

Butler Auditorium of the S. Neaman at the Technion, Haifa
16 February, 2016

Due to the large number of attendees, registration is now closed for the 4th annual conference.

If you wish to have your case reconsidered, please contact Danny Nir at dn450Metro@gmail.com


The 450Metro Consortium cordially invites you to attend its fourth annual conference.  This year, we will address advances and directions of the 450Metro consortium, in industry and in academia. We will touch upon changes that are taking place in the semiconductor industry in general and within the metrology sector, specifically.

The 450Metro Consortium deals with metrology equipment wafer handling, computation, reduction of throughput time, standardization and micro-contamination. All of these and more are at the heart of the Israeli “Metro450” Consortium and its worldwide collaborations. Our 4th annual conference is a great opportunity to learn more and take part of these exciting advances.




Butler Hall – Neaman Institute




09:00 - 09:30

Registration & Coffee

Poster session open

09:30 – 9:45

Welcome & Opening

Menachem Shoval - Metro450 Chairman

9:45 – 10:00

Office of Chief Scientist -  Magnet Program 

Ilan Peled  - Manager of the Magnet Program

10:00 – 10:20

Challenges of Next Generation Process Control Equipment

Ori Sarfaty, R&D Manager, Applied Israel

10:25 – 10:45

Dimensional & Material Metrology to Meet Industry’s Growing Needs

Dr. Shay Wolfing, CTO, Nova

10:50 – 11:15

Poster session open

Coffee break



Breakout Sessions

Track 1 – Butler Hall, Neaman Institute

Track 2 - Borovich Building Room 535

Yoram Uziel - Chair










11:15– 11:35

Active dampening

Prof. Izhak Bucher, Technion

11:15– 11:35

Mean Euclidean Distance over incomplete datasets and its applications

Prof. Ilan Shimshoni, Haifa University

11:40- 12:00

Triple use of piezo for precision motion systems

Dr. Nir Karasikov, Senior VP, Nanomotion

11:40- 12:00

Rescaling with a Purpose

Prof. Shai Avidan

12:05- 12:25

From damage Metro to better Metro

Dr. Fouad Atrash, Jordan Valley

12:05- 12:25

Finding true defects

Guy Berliner, Applied Materials

12:30- 12:50

Molecular detection

Prof. Fernando Patolsky, TAU

12:30- 12:50

Online analysis of Streaming Data

Avi Mendelson, Technion



Butler Hall – Neaman Institute




12:55 – 13:55


Poster session open

14:00 – 14:30

IoT as an enabler of efficient & effective strategy

Shmuel Barkan, J. General Manager Freescale Israel

14:35 – 14:55

Keynote – 30 years of Metrology in Israel

Isaac Mazor, President, Jordan Valley

Isaac Mazor, President, Jordan Valley

15:00 – 15:45

Structure-based super-resolution imaging and subwavelength imaging

Prof. Moti Segev, Technion

15:50 – 16:15

Poster session open

Coffee Break

16:20 – 16:40

Overview of Israeli Metrology Equipment Industry

Eliezer Shein, Samuel Neaman Institute

16:45 – 17:05

Europe and Israeli Metrology

Yoram Uziel, Applied Materials

17:10 – 17:30

Plans for Year V and beyond

Menachem Shoval, Chair, Metro450

17:35 – 17:45

Summary and recognition for best projects

Yoram Uziel – Applied Material

17:50 – 18:20

Poster session open

Cocktails + Gifts


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