a wafer metrology consortium under MAGNET

News & Events
Register for Annual Conference here
A confirmation was sent to the email account that you provided

Metro450’s 5th Annual Conference for Semiconductor Metrology

At the Wix Auditorium, Weizmann Institute, Rehovot
26 April, 2017

 Registration is now closed, please contact Yair Weissler at yair.weissler@gmail.com

For questions or additional information, please contact dn450Metro@gmail.com or yair.weissler@gmail.com

 

 

 

 

8:45

REGISTRATION

9:15

Welcome & Opening Mr. Menachem Shoval, Metro450 Chairman

9:35

Innovation Authority -  Magnet Program Mr. Ilan Peled, Manager of Technological Infrastructure Arena, Israel Innovation Authority 

9:55

Keynote:  Emerging technologies for the future of computing

Dr. Thomas Ernst, Scientific Director, CEA-LETI

10:20

Keynote: Engineering Israeli Style: Processing Alumina

Prof. Wayne D. Kaplan, Executive Vice President for Research, Technion

10:50

Coffee and Networking Poster and Demo Session

11:10

Yield Star Metrology System Applications for Advanced Process Control

Dr. Martin Ebert, Director System Engineering, Business Line Applications, ASML

11:30

Challenges of Next Generation Process Control Equipment Mr. Ron Naftali, CTO, Applied Materials Israel

11:50

Metrology Solutions for Advanced Technology Nodes Dr. Shay Wolfling, CTO, Nova Measuring Instruments

12:10

The Future of X-ray Metrology Dr. Paul Ryan, Director of Product Management X-Ray SEMI BU, Bruker

12:30

New Materials in Semiconductors

Prof. Yosi Shacham-Diamand, Director of the Research Institute for Nano Science and Nano Technology, Tel Aviv University

13:00

LUNCH

14:00

New Frontiers in Brain Surgery - Navigating the Unknown Dr. Mony Benifla, MD, Director of Pediatric Neurosurgery and an Epilepsy Surgeon, Rambam Health Care Campus

14:35

Considerations for High Precision Motion System

Dr. Nir Karasikov, Co-President, Head of R&D and Business Development, Nanomotion

14:55

Molecular Contamination Detection - not just in Semiconductor Metrology Prof. Fernando Patolsky, Tel-Aviv University

15:20

TEM Metrology Innovations and Productivity Enhancements for Semiconductor Industry Mr. Laurens F.Tz Kwakman, Sr. Strategic marketing manager, Thermo Fisher Scientific (former FEI)

15:40

SPM technology for metrology solutions: meeting the semiconductor industry’s throughput and application demand

Dr. Rodolf Herfst, Optomechatronics Scientist, TNO

16:00

Coffee and Networking Poster and Demo Session

16:15

Achieving Teraflop-Scale Computing for Machine Vision with DSP, and beyond

Mr. Bas van Bree,Business Development Manager, Prodrive

16:35

Advanced Motion System Solutions for Semiconductor Metrology Applications Mr. Hervé Stämpfli, Product Manager Motion Systems, ETEL

17:00

PANEL:  Nano-Electronics Metrology and Big Data – Challenges and Opportunities 

imec, Leti, ASML, FEI, AMIL, NOVA, TNO, Bruker, Mentor, Prodrive

17:30

Next Generation Metrology and MDM Mr. Yoram Uziel, Director of Technology, Applied Materials Israel

17:40

Summary and Recognitions Mr. Menachem Shoval, Metro450 Chairman

17:50

TOAST for the Future